Chemistry - ICP-MS analysis (1 element) - Each additional element

Comprehensive elemental characterization requires measuring multiple elements from precious analytical samples - repeating sample preparation and extraction for each element wastes material and time while introducing variability between measurements. Additional element quantification extends ICP-MS analysis to comprehensively characterize multi-element contamination profiles efficiently by analyzing the same extracted sample. Each additional element uses the same prepared extract and analytical run, maximizing data acquisition while minimizing sample consumption and analytical time through efficient use of instrumental capacity. This modular approach enables customized analysis targeting specific toxicological concerns where certain elements require quantification, regulatory requirements where markets demand specific element data, or manufacturing process validation needs assessing contamination from particular sources. Particularly valuable when initial screening reveals unexpected elements requiring quantification for risk assessment, investigating complex contamination patterns suggesting multiple sources requiring comprehensive profiling, or establishing elemental fingerprints for quality control tracking material consistency. For devices with multiple material components, comprehensive elemental analysis characterizes each material's contribution to total exposure, enabling targeted contamination control addressing specific sources. The approach proves cost-effective compared to individual element analysis because instrument setup, calibration, and quality control apply to all elements measured simultaneously, while sample preparation occurs once regardless of element count. Manufacturing investigations benefit from complete elemental profiles distinguishing between equipment wear introducing chromium and iron, environmental contamination contributing zinc and copper, or raw material impurities containing catalyst residues. The data supports root cause analysis by revealing contamination patterns - correlated elements suggesting common sources versus independent variation indicating multiple contamination routes requiring distinct corrective actions.

No.
1006073
Method
Additional element quantification by ICP-MS
Analyses category
Sample type
Finished device, Bulk material
Sample requirement (type)
Sterile or non sterile
Sample quantities
15 cm2, 0,5 gram
Equipment
ICP-MS
Lead Time Standard (Days)
unavailable
Lead Time Express (Days)
unavailable
Lead Time Super Express (Days)
unavailable
Test facility
Partner Lab
Add this test to cart to request an offer.

Do you need some help?